System of multimode STM/AFM microscopy (multiSPM)

Includes a set of five scanning probe microscopes combined with other techniques (microspectroscopy, electrochemistry) for correlation of micromorphology and physical properties (composition, adhesion, luminescence, local electronic properties) with resolution down to several  nanometers.

Přístrojové vybavení: 
  • Bruker Icon
  • Veeco Dimension 3100
  • Raman scatttering microspectroscopy coupled to AFM NT-MDT Spectra
  • NT-MDT Spectra dedicated to electrochemistry
  • Scanning electron microscopy Tescan Maia with pair of Kleindiek nanomanipulators