System of advanced transmission electron microscopy (advaTEM)

Includes in situ TEM Jeol 1200FX with acceleration voltage 120 kV for dynamic experiments (double tilt straining holder, single tilt heating-straining holder) and state-of-the-art analytical „field emission“ TEM with accelerating voltage 200kV FEI Tecnai F20 X-Twin equipped with STEM-HAADF, EDS, Lorentz microscopy, energy filter GIF.